Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods availableBOTTON, G. A; BOOTHROYD, C. B; STOBBS, W. M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 93-107, issn 0304-3991Conference Paper

A re-emitted positron energy spectrometerGOODYEAR, A; COLEMAN, P. G.Measurement science & technology (Print). 1995, Vol 6, Num 4, pp 415-421, issn 0957-0233Article

Atomic ratios determined by EELS under parallel and convergent illumination conditionsSU, D. S; WANG, H. F.Ultramicroscopy. 1995, Vol 57, Num 4, pp 323-325, issn 0304-3991Article

Intercomparison of algorithms for background correction in XPSJANSSON, C; TOUGAARD, S; ANDERSON, C. A et al.Surface and interface analysis. 1995, Vol 23, Num 7-8, pp 484-494, issn 0142-2421Article

A position-sensitive detector mounted on an inner-shell electron energy-loss spectrometerHANNAY, C; HEINESCH, J; KLEYENS, U et al.Measurement science & technology (Print). 1995, Vol 6, Num 8, pp 1140-1143, issn 0957-0233Article

Analytical background correction in numerical Fourier transform procedures. Application to electron spectroscopyAMINOV, K. L; PEDERSEN, J. B.Surface and interface analysis. 1995, Vol 23, Num 10, pp 717-722, issn 0142-2421Article

Momentum-transfer resolved electron energy loss spectroscopy of solids: problems, solutions and applicationsWANG, Y. Y; CHENG, S. C; DRAVID, V. P et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 109-119, issn 0304-3991Conference Paper

Progress in electron Compton scatteringSCHATTSCHNEIDER, P; EXNER, A.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 241-253, issn 0304-3991Conference Paper

New electrostatic cylindrical energy analyzerILYIN, A. M; ILYINA, I. A.Optik (Stuttgart). 2007, Vol 118, Num 7, pp 350-352, issn 0030-4026, 3 p.Article

Probing the dynamics of confined systems with the NIST backscattering spectrometerDIMEO, R. M; NEUMANN, D. A.Journal de physique. IV. 2000, Vol 10, Num 7, pp Pr7.337-Pr7.340, issn 1155-4339Conference Paper

A new apparatus for impact collision ion scattering spectroscopyKAWAMOTO, K; INARI, K; MORI, T et al.Japanese journal of applied physics. 1995, Vol 34, Num 9A, pp 4917-4919, issn 0021-4922, 1Article

The development of Auger spectroscopy as a probe of local electronic structureWEIGHTMAN, P.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 3, pp 263-288, issn 1154-2799Article

Analyzing line scan EELS data with neural pattern recognitionGATTS, C; DUSCHER, G; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 229-239, issn 0304-3991Conference Paper

Development of the EXELFS technique for high accuracy structural informationQIAN, M; SARIKAYA, M; STERN, E. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 137-147, issn 0304-3991Conference Paper

Recent studies of near-edge structureBROWN, L. M; WALSH, C. A; DRAY, A et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 121-125, issn 1154-2799Conference Paper

Enhanced resolution of depth profiles using two-dimensional XPS dataAMINOV, K. L; JORGENSEN, J. S; BOIDEN PEDERSEN, J et al.Surface and interface analysis. 1996, Vol 24, Num 1, pp 23-27, issn 0142-2421Article

Savitzky and Golay differentiation in AESGILMORE, I. S; SEAH, M. P.Applied surface science. 1996, Vol 93, Num 3, pp 273-280, issn 0169-4332Article

Sources of internal scattering of electrons in a cylindrical mirror analysis (CMA)EL GOMATI, M. M; EL BAKUSH, T. A.Surface and interface analysis. 1996, Vol 24, Num 3, pp 152-162, issn 0142-2421Article

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Determination of the spectrometer transmission function of XPS quantitative analysisZOMMER, L.Vacuum. 1995, Vol 46, Num 5-6, pp 617-620, issn 0042-207XConference Paper

Interactive image-spectrum EELS: application to elemental mapping of lubricant colloidsMARTIN, J.-M; LAVERGNE, J.-L; VACHER, B et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 53-63, issn 1154-2799Conference Paper

Quantitative surface chemical mapping with Auger and backscattered electron signalsPRUTTON, M; BARKSHIRE, I. R; CRONE, M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 47-62, issn 0304-3991Conference Paper

Angle-resolved electron probe microanalysis revisitedCAZAUX, J.Journal of physics. D, Applied physics (Print). 2011, Vol 44, Num 35, issn 0022-3727, 355502.1-355502.10Article

Improvement of Auger spectra using A.C. modulation techniqueRAGHEB, M. S; BAKR, M. H. S.Radiation physics and chemistry (1993). 1996, Vol 47, Num 5, pp 673-675, issn 0969-806XConference Paper

Comparison of calculated and measured inelastic cross-sections for K-, L- and M-shell ionizationSCHORSCH, P; KOHL, H; WEICKENMEIER, A. L et al.Optik (Stuttgart). 1995, Vol 99, Num 4, pp 141-146, issn 0030-4026Article